Come Together for Teams
Come Together is aimed at metrologists, designers, manufacturing engineers, and anyone who wants to understand the topic of surface metrology. Come Together brings the professional knowledge of surface metrology within the company to a common, stable, and technically competent level. Communication and process flow are significantly improved, saving time and costs. With Come Together, we provide you with the prerequisites and the space for mutual understanding, communication, exchange of experiences, and coordinated knowledge. Come as a small team to our partners and learn together with teams from other companies. Beneficially exchange your experiences. The new contacts you gain can continue to be beneficial even after the seminar. AUKOM Surf trainers are also available to come to your company. Come Together.
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SURF-1 Basics & historical classification
Historical introduction and basics of surface measurement ISO (GPS)
SURF-2 Measuring instruments and sensors
Presentation of measuring instruments and sensors for surface measurement - Tactile probing systems: -skid probing system, free probing system, optical probing systems, measuring instruments on which probing systems are installed: Mobile devices, measuring station devices, form measuring devices, coordinate measuring devices, microscopes.
SURF-3 Filtering and cut-off wavelength
Separation of profile components, roughness-waviness-shape, cutoff wavelengths, cutoff wavenumber, Fourier analysis.
Instrument selection, instrument preparation, measurement location, tolerance acceptance rules.
SURF-5 Characteristic values
Common characteristic values according to ISO 21920 & ISO 4287 from P-,W- and R-profiles, function- & production-oriented characteristic values
Specification for surface details according to ISO 1302, ISO 21920-1 and VDA 2005, differentiation from surface imperfections
Calibration, calibration, probe tip verification
SURF-8 Novelties ISO 21920
New terms, specification operators, measurement chain, details and innovations in parameters
SURF-9 Surface parameters ISO 25178
Sequence of surface measurements, filtering of surface measurements, 3D parameters, differences between profile roughness and surface roughness
SURF-10 Motif ISO 12085
Specification and measurement conditions according to ISO 12085